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p-dso-28-3 semiconductor group 1 02.96 audioprocessor tda 4390-2x type ordering code package tda 4390-2x q67000-a5183 p-dso-28-3 1 overview the tda 4390-2x is a single-chip audio sound system. the circuit can be partitioned into two functional blocks. 1.1 features 1. stereo sound processing ? four stereo af inputs ? input/output interface for external equalizer ? max. gain switchable between 0 db and 6 db ? bass and treble control ? four independent attenuators for volume balance and fader control 2. control part ? i 2 c bus interface compatible for standard and fast mode ? control of sound processing
tda 4390-2x semiconductor group 2 02.96 1.2 pin configuration (top view) figure 1 p-dso-28-3
tda 4390-2x semiconductor group 3 02.96 1.3 pin definitions and functions pin no. symbol function 1 af input 1 left 2 af input 2 left 3 af input 3 left 4 af input 3 left 5 af output switch left 6 af input tone control volume left 7 reset (all functions in power on status) 8 i 2 c bus scl 9 i 2 c bus sda 10 supply voltage 11 corner frequency treble left 12 corner frequency treble right 13 af output right front 14 af output right rear 15 af output left rear 16 af output left front 17 corner frequency bass right output 18 corner frequency bass right input 19 corner frequency bass left output 20 corner frequency bass left input 21 ground 22 blocking af operating point 23 af input tone control volume right 24 af output switch right 25 af input 4 right 26 af input 3 right 27 af input 2 right 28 af input 1 right
tda 4390-2x semiconductor group 4 02.96 1.3.1 pin description figure 2 af inputs pin 1/2/3/4/6/23/25/26/27/28 figure 3 af outputs pin 5/24
tda 4390-2x semiconductor group 5 02.96 figure 4 reset pin 7 , i 2 c bus scl pin 8 figure 5 i 2 c bus sda pin 9
tda 4390-2x semiconductor group 6 02.96 figure 6 corner frequency treble pin 11/12 figure 7 af outputs pin 13/14/15/16
tda 4390-2x semiconductor group 7 02.96 figure 8 corner frequency bass pin 17/18/19/20 figure 9 af operating point pin 22
tda 4390-2x semiconductor group 8 02.96 1.4 functional block diagram figure 10 block diagram
tda 4390-2x semiconductor group 9 02.96 2 circuit description 2.1 signal processing 1. the selection of the af inputs happens in the input switch. there are four stereo inputs available. an input level switch circuitry behind the input switch realizes the adaption of different signal source levels. a gain of 0 db or 6 db is possible. after this section a stereo output/input is placed for connecting external circuits like an equalizer. 2. in the following signalpath there is tone control, consisting of bass and treble control. bass control offers a control range of + 18 db to C 12 db with a stepwidth of 2 db. frequency characteristic, 1st order or 2nd order (resonance type) is fixed by external components. treble control offers a control range of 12 db with a stepwidth of 2 db. the treble control corner frequency is fixed by an external capacitor. last stage in signalpath is volume control which can be adjusted independent for left, right, rear and front. 57 steps with an increment of 1.25 db give a setting range of 70 db, the 57th step activates muting. 2.2 controlpart all functions are controlled via an i 2 c bus interface. all data is stored into a latch circuit. the telegram structure is built as follows: startcondition C chipaddress C any number of databytes C stopcondition. for the databytes the following conditions must be fulfilled: before transmitting a databyte a subaddress byte must first be placed in the data telegram.
tda 4390-2x semiconductor group 10 02.96 2.2.1 chipaddress 2.2.2 subaddress bytes 2.2.3 controlbytes a) volume left, right, front, rear msb lsb 10000010 msb lsb volume front left 000 volume front right 001 volume rear left 010 volume rear right 011 bass/treble 101 switchbyte 111 msb lsb max. volume 111111 max-1 111110 max-16 110000 max-55 001000 mute 000111 mute 000000 mute 000 power on 0 0 0 0 0001
tda 4390-2x semiconductor group 11 02.96 b) treble/bass msb lsb linear 1 0 001001 max. treble, lin. bass 0 0 101001 max. treble, lin. bass 0 0 0 1001 min. treble, lin. bass 1 1 101001 min. treble, lin. bass 1 1 1 1001 lin. treble, max. bass 1 0 000000 lin. treble, min. bass 1 0 001111 max. treble, max. bass 0 0 0 0000 min. treble, min. bass 1 1 1 1111 power on 0 0 000001 msb treble lsb treble msb bass lsb bass
tda 4390-2x semiconductor group 12 02.96 c) switchbyte if no signal is activated, this is interpreted as muting. there is no mutual lockout of the inputs for multiple selections. msb lsb mute in1 in2 in3 in4 gain mute = 0 mute = 1 mute off; power on mute on in1 = 0 in1 = 1 input1 off; power on input1 on in2 = 0 in2 = 1 input1 off; power on input1 on in3 = 0 in3 = 1 input1 off; power on input1 on in4 = 0 in4 = 1 input1 off; power on input1 on gain = 0 gain = 1 gain 0 db; power on gain 6 db
tda 4390-2x semiconductor group 13 02.96 3 electrical characteristics 3.1 absolute maximum ratings t a = C 40 c to 85 c parameter symbol limit values unit remarks min. max. supply voltage v 10 014v max. dc voltage v 1 0 v 10 v max. dc voltage v 2 0 v 10 v max. dc voltage v 3 0 v 10 v max. dc voltage v 4 0 v 10 v max. dc voltage v 6 0 v 10 v max. dc voltage v 7 0 v 10 v max. dc voltage v 8 06v max. dc voltage v 11 0 v 10 v max. dc voltage v 12 0 v 10 v max. dc voltage v 18 0 v 10 v max. dc voltage v 20 0 v 10 v max. dc voltage v 22 0 v 10 v max. dc voltage v 23 0 v 10 v max. dc voltage v 25 0 v 10 v max. dc voltage v 26 0 v 10 v max. dc voltage v 27 0 v 10 v max. dc voltage v 28 0 v 10 v max. dc current i 5 02ma max. dc current i 9 02ma max. dc current i 13 02ma max. dc current i 14 02ma
tda 4390-2x semiconductor group 14 02.96 note: maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit. 3.2 operating range note: in the operating range the functions given in the circuit description are fulfilled. max. dc current i 15 02ma max. dc current i 16 02ma max. dc current i 17 02ma max. dc current i 19 02ma max. dc current i 24 02ma junction temperature t j 150 c storage temperature t s C 40 125 c thermal resistance r thsa 76 k/w parameter symbol limit values unit min. max. supply voltage v s 7.5 13.2 v ambient temperature range t a C40 85 c input frequency range | i 0.01 20 khz 3.1 absolute maximum ratings (contd) t a = C 40 c to 85 c parameter symbol limit values unit remarks min. max.
tda 4390-2x semiconductor group 15 02.96 3.3 ac/dc characteristics v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max. af reference level 0 db = 150 mv, f i = 1 khz, if not stated otherwise. i 2 c bus preset: start C 82 C 00, 3f C 01, 3f C 02, 3f C 03, 3f C 05, 89 C 07, 40 C stop chipaddr. C vol 63 C vol 63 C vol 63 C vol 63 C tone lin C in1 the basic setting for each point in the specification is always preset; only settings which are deviate from this, are given in the test conditions. details in italics only provide explanation of the hexadecimal code and which switch bits on the setbytes are stated. current consumption i 10 39 55 ma 1 a. signal section gain 1) v 5-1 C101db 1 gain 1) v 24-28 C101db 1 gain 1) v 5-1 567db 07, 44; gain = 6 db 1 gain 1) v 24-28 567db 07, 44; gain = 6 db 1 max. gain v 15-6 C202db 1 max. gain v 16-6 C202db 1 max. gain v 13-23 C202db 1 max. gain v 14-23 C202db 1 min. gain v 15-6 C 70 C 60 db 00, 08-02, 08; vol 8 1 min. gain v 16-6 C 70 C 60 db 00, 08-02, 08; vol 8 1 min. gain v 13-23 C 70 C 60 db 01, 08-03, 08; vol 8 1 min. gain v 14-23 C 70 C 60 db 01, 08-03, 08; vol 8 1 tracking error d v 13-14 3 db 01, 3f to 01, 24 03, 3f to 03, 24; vol 63-36 1 tracking error d v 15-16 3 db 00, 3f to 00, 24 02, 3f to 02, 24; vol 63-36 1 tracking error d v 13-16 3 db 00, 3f to 00, 24 01, 3f to 01, 24; vol 63-36 1 tracking error d v 14-15 3 db 02, 3f to 02, 24 03, 3f to 03, 24; vol 63-36 1 1) same values apply for feeding in on pins 2 4, and 25 27.
tda 4390-2x semiconductor group 16 02.96 step width vol 13 d v 13 0 1.25 2.5 db 01, x-01, (x 1) vol x-vol (x 1) 1 step width vol 14 d v 14 0 1.25 2.5 db 03, x-03, (x 1) vol x-vol (x 1) 1 step width vol 15 d v 15 0 1.25 2.5 db 02, x-02, (x 1) vol x-vol (x 1) 1 step width vol 16 d v 16 0 1.25 2.5 db 02, x-02, (x 1) vol x-vol (x 1) 1 bass boost v 15-6 15 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 16-6 15 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 13-23 15 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 14-23 15 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 15-6 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 16-6 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 13-23 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 14-23 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 step width bass d v 13 123db 05, 8x-05,8 (x 1) bass x-bass (x 1) 1 step width bass d v 14 123db 05, 8x-05,8 (x 1) bass x-bass (x 1) 1 step width bass d v 15 123db 05, 8x-05,8 (x 1) bass x-bass (x 1) 1 step width bass d v 16 123db 05, 8x-05,8 (x 1) bass x-bass (x 1) 1 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 17 02.96 treble boost v 15-6 9 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 16-6 9 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 13-23 9 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 14-23 9 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 15-6 9 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 15-6 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 16-6 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 13-23 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 14-23 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 step width treble d v 13 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 14 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 15 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 16 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 18 02.96 tone linearity d v 13 3 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 14 3 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 15 3 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 16 3 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 channel separation d v 14-15 60 db v 6 or v 23 = 300 mvrms 1 channel separation d v 13-16 60 db v 6 or v 23 = 300 mvrms 1 crosstalk of the switch 1) a input unwanted/ output wanted 80 db v i wanted = 0 v i unwanted = 300 mvrms 1 attenuation mute 2) a 1-5 80 db 01, 00-03, 00; v 1 = 300 mvrms ; vol 0 1 attenuation mute 2) a 1-5 80 db 07, c0; v 1 = 300 mvrms mute active 1 attenuation mute 2) a 1-5 80 db 07, 00; v 1 = 300 mvrms not select 1 attenuation mute 3) a 28-24 80 db 00, 00 to 03, 00; v 28 = 300 mvrms; vol 0 1 attenuation mute 3) a 28-24 80 db 07, 00; v 28 = 300 mvrms mute active 1 attenuation mute 3) a 28-24 80 db 07, 00; v 28 = 300 mvrms not select 1 1) same values apply for feeding in on pins 1 4 or 25 28, and measurement on pins 5 or 24. 2) analogous values apply for feeding in on pins 2, 3, 4. 3) same values apply for feeding in on pins 25, 26, 27. 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 19 02.96 max. input voltage 1) v 1 1.5 vrms k 15, 16 1%; r l15, 16 = 2.2 k w 1 max. input voltage 1) v 1 0.75 vrms k 15, 16 1 %; 07, 44 r l15, 16 = 2.2 k w 1 max. input voltage 2) v 28 1.5 vrms k 13, 14 1%; r l13, 14 = 2.2 k w 1 max. input voltage 2) v 28 0.75 vrms k 13, 14 1 %; 07, 44 r l13, 14 = 2.2 k w 1 max. input voltage v 6 250 vrms k 15, 16 < 1 %; 05, xx any sound 1 max. input voltage v 23 250 vrms k 13, 14 < 1 %; 05, xx any sound 1 max. output voltage v 13 2.0 vrms k 13 < 1 % 1 max. output voltage v 14 2.0 vrms k 14 < 1 % 1 max. output voltage v 15 2.0 vrms k 15 < 1 % 1 max. output voltage v 16 2.0 vrms k v < 1 % 1 distortion 3) k 5 0.01 0.1 % v 1 = 150 mvrms 1 distortion 3) k 24 0.01 0.1 % v 28 = 150 mvrms 1 distortion 3) k 13 0.01 0.1 % v 28 = 150 mvrms 1 distortion 3) k 14 0.01 0.1 % v 28 = 150 mvrms 1 distortion 3) k 15 0.01 0.1 % v 1 = 150 mvrms 1 distortion 3) k 16 0.01 0.1 % v 1 = 150 mvrms 1 distortion 3) k 13 0.01 0.1 % v 28 = 150 mvrms 01, 2f; vol 47 1 distortion 3) k 14 0.01 0.1 % v 28 = 150 mvrms 03, 2f; vol 47 1 distortion 3) k 15 0.01 0.1 % v 1 = 150 mvrms 02, 2f; vol 47 1 distortion 3) k 16 0.01 0.1 % v 1 = 150 mvrms 00, 2f; vol 47 1 1) same values apply for feeding in on pins 2, 3, 4. 2) same values apply for feeding in on pins 25, 26, 27. 3) same values apply for feeding in on pins 2 4 or 25 27. 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 20 02.96 distortion 1) k 13 0.05 0.5 % v 28 = 150 mvrms 05, xx; any sound 1 distortion 1) k 14 0.05 0.5 % v 28 = 150 mvrms 05, xx; any sound 1 distortion 1) k 15 0.05 0.5 % v 1 = 150 mvrms 05, xx; any sound 1 distortion 1) k 16 0.05 0.5 % v 1 = 150 mvrms 05, xx; any sound 1 signal/noise ratio 1) a s/n13 80 95 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 1 signal/noise ratio 1) a s/n14 80 95 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 1 signal/noise ratio 1) a s/n15 80 95 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 1 signal/noise ratio 1) a s/n16 80 95 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 1 signal/noise ratio 1) a s/n13 60 80 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 01, 27; vol 39 1 signal/noise ratio 1) a s/n14 60 80 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 03, 27; vol 39 1 signal/noise ratio 1) a s/n15 60 80 db v nrms 20 hz-20 khz v 1 = 0.3 vrms; 02, 27 1 signal/noise ratio 1) a s/n16 60 80 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 00, 27; vol 39 1 1) same values apply for feeding in on pins 2 4 or 25 27. 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 21 02.96 noise voltage v n13 210 m vrms v nrms 20 hz-20 khz 01, 00-03, 00; vol 0 1 noise voltage v n14 210 m vrms v nrms 20 hz-20 khz 00, 00-03, 00; vol 0 1 noise voltage v n15 210 m vrms v nrms 20 hz-20 khz 00, 00-02, 00; vol 0 1 noise voltage v n16 210 m vrms v nrms 20 hz-20 khz 01, 00-02, 00; vol 0 1 dc jump d 1 bit d v 13 10 mv 01, x-01, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 14 10 mv 03, x-03, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 15 10 mv 02, x-02, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 16 10 mv 00, x-00, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 13 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 14 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 15 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 16 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 psrr a psrr13 70 db v undesired = 1 vrms f undesired = 100 hz 20 khz 1 psrr a psrr14 70 db input termination with 220 w 1 psrr a psrr15 70 db measurement rms according ccir 651 1 psrr a psrr16 70 db 1 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 22 02.96 design hints input resistance r 1 22 27 k w input resistance r 2 22 27 k w input resistance r 3 22 27 k w input resistance r 4 22 27 k w input resistance r 6 24 30 k w input resistance r 23 24 30 k w input resistance r 25 22 27 k w input resistance r 26 22 27 k w input resistance r 27 22 27 k w input resistance r 28 22 27 k w output resistance r 5 200 w output resistance r 13 200 w output resistance r 14 200 w output resistance r 15 200 w output resistance r v 200 w output resistance r 24 200 w v s = 8.5 v max. input voltage v 6 180 mvrms k 15, 16 < 5 %; 05, xx any sound 1 max. input voltage v 23 180 mvrms k 13, 14 < 5 %; 05, xx any sound 1 bass boost v 15-6 10 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 16-6 10 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 13-23 10 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 14-23 10 12 db 05,83; f i =40hz bass step 6, treble lin 1 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 23 02.96 v s = 12 v max. input voltage v 6 300 mvrms k 15, 16 < 1 %; 05, xx any sound 1 max. input voltage v 23 300 mvrms k 13, 14 < 1 %; 05, xx any sound 1 b. i 2 c bus (scl, sda edges) rise time t r 300 ns fall time t f 300 ns shift register clock pulse scl frequency f scl 0 400 khz h-pulse width t high 0.6 m s l-pulse width t low 1.3 m s start set-up time t susta 0.6 m s hold time t hdsta 0.6 m s stop set-up time t susto 0.6 m s bus free time t buf 1.3 m s data transfer set-up time t sudat 100 m s hold time t hddat 0 0.9 m s 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 24 02.96 note: the listed characteristics are ensured over the operating range of the integrated circuit. typical characteristics specify mean values expected over the production spread. if not otherwise specified, typical characteristics apply at t a =25 c and the given supply voltage. inputs scl, sda input voltage v qh 3 5.5 v v ql 1.5 v hysteresis v hys 0.2 v spike suppression t sp 50 ns input current i qh 50 m a v ql 100 m a output sda (open collector) output voltage v qh 5.4 v r l = 2.5 k w v ql 0.4 v i ql = 3 ma reset inactive v l 1.5 v reset active v h 3 5.5 v 3.3 ac/dc characteristics (contd) v s = 10 v, t a = C 40 c to 85 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 25 02.96 3.4 ac/dc characteristics v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max. af reference level 0 db = 150 mv, f i = 1 khz, if not stated otherwise. i 2 c bus preset: start C 82 C 00, 3f C 01, 3f C 02, 3f C 03, 3f C 05, 89 C 07, 40 C stop chipaddr. C vol 63 C vol 63 C vol 63 C vol 63 C tone lin C in1 the basic setting for each point in the specification is always preset; only settings which are deviate from this, are given in the test conditions. details in italics only provide explanation of the hexadecimal code and which switch bits on the setbytes are stated. current consumption i 10 39 50 ma 1 a. signal section gain 1) v 5-1 C101db 1 gain 1) v 24-28 C101db 1 gain 1) v 5-1 567db 07, 44; gain = 6 db 1 gain 1) v 24-28 567db 07, 44; gain = 6 db 1 max. gain v 15-6 C202db 1 max. gain v 16-6 C202db 1 max. gain v 13-23 C202db 1 max. gain v 14-23 C202db 1 min. gain v 15-6 C 70 C 65 db 00, 08-02, 0; 8 vol 8 1 min. gain v 16-6 C 70 C 65 db 00, 08-02, 0; 8 vol 8 1 min. gain v 13-23 C 70 C 65 db 01, 08-03, 0; 8 vol 8 1 min. gain v 14-23 C 70 C 65 db 01, 08-03, 08; vol 8 1 tracking error d v 13-14 2 db 01, 3f to 01, 24 03, 3f to 03, 24; vol 63-36 1 tracking error d v 15-16 2 db 00, 3f to 00, 24 02, 3f to 02, 24; vol 63-36 1 tracking error d v 13-16 2 db 00, 3f to 00, 24 01, 3f to 01, 24; vol 63-36 1 tracking error d v 14-15 2 db 02, 3f to 02, 24 03, 3f to 03, 24; vol 63-36 1 1) same values apply for feeding in on pins 2 4, and 25 27.
tda 4390-2x semiconductor group 26 02.96 step width vol 13 d v 13 0 1.25 2.5 db 01, x-01, (x 1) vol x-vol (x 1) 1 step width vol 14 d v 14 0 1.25 2.5 db 03, x-03, (x 1) vol x-vol (x 1) 1 step width vol 15 d v 15 0 1.25 2.5 db 02, x-02, (x 1) vol x-vol (x 1) 1 step width vol 16 d v 16 0 1.25 2.5 db 00, x-00, (x 1) vol x-vol (x 1) 1 bass boost v 15-6 16 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 16-6 16 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 13-23 16 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 14-23 16 18 db 05, 80; f i = 40 hz bass max, treble lin 1 bass boost v 15-6 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 16-6 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 13-23 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 bass boost v 14-23 C 12 db 05, 8f; f i = 40 hz bass min, treble lin 1 step width bass d v 13 123db 05, 8x-05, 8 (x 1) bass x-bass (x 1) 1 step width bass d v 14 123db 05, 8x-05, 8 (x 1) bass x-bass (x 1) 1 step width bass d v 15 123db 05, 8x-05, 8 (x 1) bass x-bass (x 1) 1 step width bass d v 16 123db 05, 8x-05, 8 (x 1) bass x-bass (x 1) 1 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 27 02.96 treble boost v 15-6 10 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 16-6 10 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 13-23 10 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 14-23 10 12 db 05, 09; f i = 15 khz treble max, bass lin 1 treble boost v 15-6 10 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 15-6 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 16-6 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 13-23 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 treble boost v 14-23 C 12 db 05, f9; f i = 15 khz treble min, bass lin 1 step width treble d v 13 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 14 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 15 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 step width treble d v 16 123db 05, x9-05, (x 1) 9 treble x-treble (x 1) 1 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 28 02.96 tone linearity d v 13 2 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 14 2 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 15 2 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 tone linearity d v 16 2 db 05, 89; f i = 40 hz 15 khz treble, bass lin 1 channel separation d v 14-15 60 db v 6 or v 23 = 300 mvrms 1 channel separation d v 13-16 60 db v 6 or v 23 = 300 mvrms 1 crosstalk of the switch 1) a input unwanted/ output wanted 80 db v i wanted = 0 v i unwanted = 300 mvrms 1 attenuation mute 2) a 1-5 80 db 01, 00-03, 00; v 1 = 300 mvrms; vol 0 1 attenuation mute 2) a 1-5 80 db 07, c0; v 1 = 300 mvrms mute active 1 attenuation mute 2) a 1-5 80 db 07, 00; v 1 = 300 mvrms not select 1 attenuation mute 3) a 28-24 80 db 00, 00 to 03, 00; v 28 = 300 mvrms; vol 0 1 attenuation mute 3) a 28-24 80 db 07, c0; v 28 = 300 mvrms mute active 1 attenuation mute 3) a 28-24 80 db 07, 00; v 28 = 300 mvrms not select 1 1) same values apply for feeding in on pins 1 4 or 25 28, and measurement on pins 5 or 24. 2) analogous values apply for feeding in on pins 2, 3, 4. 3) same values apply for feeding in on pins 25, 26, 27. 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 29 02.96 max. input voltage 1) v 1 2 vrms k 15, 16 1%; r l15, 16 = 2.2 k w 1 max. input voltage 1) v 1 1 vrms k 15, 16 1 %; 07, 44 r l15, 16 = 2.2 k w 1 max. input voltage 2) v 28 2 vrms k 13, 14 1%; r l13, 14 = 2.2 k w 1 max. input voltage 2) v 28 1 vrms k 13, 14 1 %; 07, 44 r l13, 14 = 2.2 k w 1 max. input voltage v 6 280 vrms k 15, 16 < 1 %; 05, xx any sound 1 max. input voltage v 23 280 vrms k 13, 14 < 1 %; 05, xx any sound 1 max. output voltage v 13 2.2 vrms k 13 < 1 % 1 max. output voltage v 14 2.2 vrms k 14 < 1 % 1 max. output voltage v 15 2.2 vrms k 15 < 1 % 1 max. output voltage v 16 2.2 vrms k 16 < 1 % 1 distortion 3) k 5 0.01 0.05 % v 1 = 150 mvrms 1 distortion 3) k 24 0.01 0.05 % v 28 = 150 mvrms 1 distortion 3) k 13 0.01 0.05 % v 28 = 150 mvrms 1 distortion 3) k 14 0.01 0.05 % v 28 = 150 mvrms 1 distortion 3) k 15 0.01 0.05 % v 1 = 150 mvrms 1 distortion 3) k 16 0.01 0.05 % v 1 = 150 mvrms 1 distortion 3) k 13 0.01 0.1 % v 28 = 150 mvrms 01, 2f; vol 47 1 distortion 3) k 14 0.01 0.1 % v 28 = 150 mvrms 03, 2f; vol 47 1 distortion 3) k 15 0.01 0.1 % v 1 = 150 mvrms 02, 2f; vol 47 1 distortion 3) k 16 0.01 0.1 % v 1 = 150 mvrms 00, 2f; vol 47 1 1) same values apply for feeding in on pins 2, 3, 4. 2) same values apply for feeding in on pins 25, 26, 27. 3) same values apply for feeding in on pins 2 4 or 25 27. 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 30 02.96 distortion 1) k 13 0.05 0.2 % v 28 = 150 mvrms 05, xx; any sound 1 distortion 1) k 14 0.05 0.2 % v 28 = 150 mvrms 05, xx; any sound 1 distortion 1) k 15 0.05 0.2 % v 1 = 150 mvrms 05, xx; any sound 1 distortion 1) k 16 0.05 0.2 % v 1 = 150 mvrms 05, xx; any sound 1 signal/noise ratio 1) a s/n13 90 95 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 1 signal/noise ratio 1) a s/n14 90 95 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 1 signal/noise ratio 1) a s/n15 90 95 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 1 signal/noise ratio 1) a s/n16 90 95 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 1 signal/noise ratio 1) a s/n13 70 80 db v nrms 20 hz-20 khz v 28 = 0.3 vrms 01, 27; vol 39 1 signal/noise ratio 1) a s/n14 70 80 db v nrms 20 hz-20 kh z v 28 = 0.3 vrms 03, 27; vol 39 1 signal/noise ratio 1) a s/n15 70 80 db v nrms 20 hz-20 khz v 1 = 0.3 vrms; 02, 27 1 signal/noise ratio 1) a s/n16 70 80 db v nrms 20 hz-20 khz v 1 = 0.3 vrms 00, 27; vol 39 1 1) same values apply for feeding in on pins 2 4 or 25 27. 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 31 02.96 noise voltage v n13 25 m vrms v nrms 20 hz-20 khz 01, 00-03, 00; vol 0 1 noise voltage v n14 25 m vrms v nrms 20 hz-20 khz 01, 00-03, 00; vol 0 1 noise voltage v n15 25 m vrms v nrms 20 hz-20 khz 00, 00-02, 00; vol 0 1 noise voltage v n16 25 m vrms v nrms 20 hz-20 khz 00, 00-02, 00; vol 0 1 dc jump d 1 bit d v 13 10 mv 01, x-01, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 1 4 10 mv 03, x-03, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 15 10 mv 02, x-02, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 16 10 mv 00, x-00, (x 1) vol x-vol (x 1) 1 dc jump d 1 bit d v 13 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 14 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 15 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 dc jump d 1 bit d v 16 10 mv 05, x-05, (x 1) tone x-tone (x 1) 1 psrr a psrr13 70 db v undesired = 1 vrms f undesired = 100 hz 20 khz 1 psrr a psrr14 70 db input termination with 220 w 1 psrr a psrr15 70 db measurement rms according ccir 651 1 psrr a psrr16 70 db 1 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 32 02.96 design hints input resistance r 1 23 27 k w input resistance r 2 23 27 k w input resistance r 3 23 27 k w input resistance r 4 23 27 k w input resistance r 6 25.5 30 k w input resistance r 23 25.5 30 k w input resistance r 25 23 27 k w input resistance r 26 23 27 k w input resistance r 27 23 27 k w input resistance r 28 23 27 k w output resistance r 5 200 w output resistance r 13 200 w output resistance r 14 200 w output resistance r 15 200 w output resistance r 16 200 w output resistance r 24 200 w v s = 8.5 v max. input voltage v 6 220 mvrms k 15, 16 < 5 %; 05, xx any sound 1 max. input voltage v 23 220 mvrms k 13, 14 < 5 %; 05, xx any sound 1 bass boost v 15-6 11 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 16-6 11 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 13-23 11 12 db 05,83; f i =40hz bass step 6, treble lin 1 bass boost v 14-23 11 12 db 05,83; f i =40hz bass step 6, treble lin 1 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 33 02.96 v s = 12 v max. input voltage v 6 370 mvrms k 15, 16 < 1 %; 05, xx any sound 1 max. input voltage v 23 370 mvrms k 13, 14 < 1 %; 05, xx any sound 1 b. i 2 c bus (scl, sda edges) rise time t r 300 ns fall time t f 300 ns shift register clock pulse scl frequency f scl 0 400 khz h-pulse width t high 0.6 m s l-pulse width t low 1.3 m s start set-up time t susta 0.6 m s hold time t hdsta 0.6 m s stop set-up time t susto 0.6 m s bus free time t buf 1.3 m s data transfer set-up time t sudat 100 m s hold time t hddat 0 0.9 m s 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 34 02.96 note: the listed characteristics are ensured over the operating range of the integrated circuit. typical characteristics specify mean values expected over the production spread. if not otherwise specified, typical characteristics apply at t a =25 c and the given supply voltage. inputs scl, sda input voltage v qh 3 5.5 v v ql 1.5 v hysteresis v hys 0.2 v spike suppression t sp 50 ns input current i qh 50 m a v ql 100 m a output sda (open collector) output voltage v qh 5.4 v r l = 2.5 k w v ql 0.4 v i ql = 3 ma reset inactive v l 1.5 v reset active v h 3 5.5 v 3.4 ac/dc characteristics (contd) v s = 10 v, t a = 25 c parameter symbol limit values unit test condition test circuit min. typ. max.
tda 4390-2x semiconductor group 35 02.96 figure 11 test circuit
tda 4390-2x semiconductor group 36 02.96 figure 12 application circuit
tda 4390-2x semiconductor group 37 02.96 figure 13 application circuit
tda 4390-2x semiconductor group 38 02.96 figure 14 i 2 c bus timing
tda 4390-2x semiconductor group 39 02.96 4 package outlines p-dso-28-3 (plastic dual small outline package) gps05182 sorts of packing package outlines for tubes, trays etc. are contained in our data book package information. dimensions in mm smd = surface mounted device

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